Le 29 mai 2018
De 12h45 à 13h45
François-Xavier Pineau (ObAS)
Results of probabilistic cross-matches taking into account photometric parameters.
After a brief introduction to the statistical basis and practical limitations of multi-catalogue positional cross-matches, we will see how to take into account photometric information to enhance purely positional probabilities. We will compare the results in Salvato et al. (2018) with the ones obtained by combining the ARCHES Xmatch tool output with photometric likelihoods derived from a Kernel Density Classification. We will also show the results we obtain by applying the method to the XMM vs SDSS cross-match. Finally, the limits reached when generalizing the method to more than a few catalogues will be highlighted.